FormFactor, Inc. and MicroProbe Select International Test Conference 2012 for First Appearance as United Company
The combined company's portfolio contains a comprehensive range of products and technologies to enable and accelerate the roadmaps of System-On-Chip (SoC) and memory semiconductor device manufacturers.
At ITC, the premier discussion forum for advanced wafer test technologies,
"Parallel Parametric Test in Semiconductor Production"
Co-presentation by technologists from Agilent and
Session 4: 3D Wafer Probing
"40um Pitch Probe Card Evaluation"
Co-presentation by technologists from Altera Corp. and
In addition to the presentations,
Further information on the 2012 ITC, including the
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Forward-Looking Statements:
Statements in this press release that are not strictly historical in nature are forward-looking statements within the meaning of the federal securities laws, including statements regarding anticipated results, market conditions, expectations and operating plans. These forward-looking statements are based on current information and expectations that are inherently subject to change and involve a number of risks and uncertainties. Actual events or results might differ materially from those in any forward-looking statement due to various factors, including, but not limited to: the company's ability to successfully integrate and realize the anticipated benefits of the Micro-Probe acquisition; risks around the company's ability to enable and accelerate the roadmaps of SoC and memory semiconductor device manufacturers; and risks of the company's ability to meet customers' test roadmaps.
Additional information concerning factors that could cause actual events or results to differ materially from those in any forward-looking statement is contained in the company's Form 10-K for the fiscal year ended
FORM-F
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